Available techniques
- Scanning electron microscopy (SEM)
- Focused ion beam (FIB) milling and imaging
- X-ray energy dispersive spectrometry (XEDS)
- Electron backscattered diffraction (EBSD)
- Cryo electron microscopy
- Transmission electron microscopy (TEM)
- diffraction imaging
- high resolution (HREM)
- scanning (STEM)
- aberration-corrected
- In-situ electron microscopy
- (straining, heating, indentation)
- Electron energy loss spectrometry (EELS)
- Atom probe microscopy (APM)
- Atomic force microscopy (AFM)
- X-ray photoelectron spectroscopy (XPS)
- tribo/pico-indentation
- Sample preparation
Instruments
- Specimen preparation
- Philips XL30 FEG SEM
- FEI Quanta 3D e-SEM/FIB
- FEI Nova 200 Nanolab SEM/FIB
- FEI Helios 650 Nanolab SEM/FIB
- JEOL 2010F Analytical Electron Microscope
- JEOL 2100F Probe-corrected Electron Microscope
- JEOL 3011 High Resolution Electron Microscope
- JEOL 3100R05 Double Cs Corrected TEM/STEM
- Cameca LEAP 4000X HR Atom Probe
- Veeco Dimension Icon AFM
- Kratos Axis Ultra XPS
- Hysitron tribo-indenter
- Specialty holders and stages
- Hysitron pico-indenter
