Techniques and Instruments

Specimen Preparation

• Equipment

Scanning Electron Microscopy (SEM)

• TESCAN MIRA3 FEG SEM
• TESCAN RISE

Scanning Electron and Focused Ion Beam Instruments (SEM/FIB)

• Thermo Fisher Nova 200 Nanolab SEM/FIB
• Thermo Fisher Helios 650 Nanolab SEM/FIB
• Thermo Fisher Helios G4 PFIB UXe

Transmission Electron Microscopy

• Thermo Fisher Talos F200X G2 S/TEM
• Thermo Fisher Tecnai G2 F30 TWIN Electron Microscope
• JEOL 2010F Analytical Electron Microscope
• JEOL 2100F Probe-Corrected Electron Microscope
• JEOL 3100R05 Double Cs Corrected TEM/STEM

Atom Probe Tomography

• Cameca LEAP 5000HR

3D X-ray Microscopy

• Zeiss Xradia Versa 520 3D X-ray Microscope with DCT module

Atomic Force Microscopy

• Veeco Dimension Icon AFM

X-ray PhotoElectron Spectroscopy

• Kratos Axis Ultra XPS 

Mechanical Properties

• Hysitron TriboIndenter