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Michigan Center for Materials Characterization > Techniques and Instruments
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Materials Characterization

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Techniques and Instruments

Specimen Preparation

  • Equipment

Scanning Electron Microscopy (SEM)

  • TESCAN MIRA3 FEG SEM
  • TESCAN RISE

Scanning Electron and Focused Ion Beam Instruments (SEM/FIB)

  • Thermo Fisher Nova 200 Nanolab SEM/FIB
  • Thermo Fisher Helios 650 Nanolab SEM/FIB
  • Thermo Fisher Helios G4 PFIB UXe

Transmission Electron Microscopy

  • Thermo Fisher Spectra 300 Probe-Corrected S/TEM
  • Thermo Fisher Talos F200X G2 S/TEM
  • Thermo Fisher Tecnai G2 F30 TWIN Electron Microscope
  • JEOL 3100R05 Double Cs Corrected TEM/STEM

Atom Probe Tomography

  • Cameca LEAP 5000HR

3D X-ray Microscopy

  • Zeiss Xradia Versa 520 3D X-ray Microscope with DCT module

Atomic Force Microscopy

  • Veeco Dimension Icon AFM

X-ray PhotoElectron Spectroscopy

  • Kratos Axis Ultra XPS 

Mechanical Properties

  • Hysitron TriboIndenter

Michigan Center for Materials Characterization

mc2-staff@umich.edu

NCRC B22, Rm G011, 2800 Plymouth Rd, Ann Arbor MI 48109

Michigan Engineering

1221 Beal Ave. Ann Arbor, MI 48109-2102

+1 (734) 647-7000

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