Techniques and instruments

Available techniques

  • Scanning electron microscopy (SEM)
  • Focused ion beam (FIB) milling and imaging
  • X-ray energy dispersive spectrometry (XEDS)
  • Electron backscattered diffraction (EBSD)
  • Cryo electron microscopy
  • Transmission electron microscopy (TEM)
    • diffraction imaging
    • high resolution (HREM)
    • scanning (STEM)
    • aberration-corrected
  • In-situ electron microscopy
    • (straining, heating, indentation)
  • Electron energy loss spectrometry (EELS)
  • Atom probe microscopy¬†(APM)
  • Atomic force microscopy (AFM)
  • X-ray photoelectron spectroscopy (XPS)
  • tribo/pico-indentation
  • Sample preparation