Techniques and instruments

• Equipment

Scanning Electron Microscopy (SEM)

• Tescan MIRA3 FEG SEM

Scanning Electron and Focus ion beam instruments (SEM/FIB)

• FEI Quanta 3D e-SEM/FIB
• FEI Nova 200 Nanolab SEM/FIB
• FEI Helios 650 Nanolab SEM/FIB

Transmission Electron Microscopy

• JEOL 2010F Analytical Electron Microscope
• JEOL 2100F Probe-corrected Electron Microscope
• JEOL 3011 High Resolution Electron Microscope
• JEOL 3100R05 Double Cs Corrected TEM/STEM

Atom probe tomography

• Cameca LEAP 5000HR

3D X-ray Microscopy

• Zeiss Xradia Versa 520 3D X-ray Microscope with DCT module

Atomic Force Microscopy

• Veeco Dimension Icon AFM

X-ray PhotoElectron Spectroscopy

• Kratos Axis Ultra XPS 

Mechanical properties

• Hysitron tribo-indenter