Zeiss Xradia Versa 520 3D X-ray Microscope

Applications

Materials Science, Life Sciences, Geological Sciences, Devices, Defect & Failure Analysis

  • Non-destructive imaging and reconstruction of buried features (pores, particles, defects, etc.)  
  • Phase contrast imaging for studying low Z or “near Z” elements
  • Diffraction contrast for the study of crystallographic orientation
  • Maintains resolution at a distance for non-destructive in situ imaging
  • Multiscale imaging, characterization of large samples at high throughput

Contact

Nancy Senabulya Muyanja

Location

Room G029

Acknowledgments

Publications, presentations, and posters resulting from work on this instrument should state: “The authors acknowledge the financial support of the University of Michigan College of Engineering and technical support from the Michigan Center for Materials Characterization.”

Specifications

  • Spatial Resolution: 0.7µm
  • Resolution at a Distance (RaaD)* at 50 mm working distance: 1.0 µm
    • RaaD working distance defined as clearance around axis of rotation
  • X-ray Source: Sealed transmission
  • Tube Voltage Range: 30 – 160 kV
  • Maximum Power Output: 10 W
  • Radiation safety: < 1 μS/hr (equivalent to 0.10 mRem/hr)
  • Standard Objective: 0.4X, 4X, 20X, 40X Magnification
  • Sample Stage
    • Load capacity: 25 kg
    • Stage translation (x, y, z): 45, 100, 50 mm
    • Stage rotation: 360˚
    • Sample size Limit: 300 mm
  • Modules
    • Absorption contrast
    • Phase contrast
    • LabDCT Diffraction Contrast Tomography
    • Scout and scan control system
    • High-Aspect Ratio Tomography
    • Automated Filter Changer
    • DSCoVer Dual Scan Contrast Visualizer
  • Included Software
    • Scout-and-Scan Control System, GrainMapper 3D, Dragonfly

This facility DOES NOT perform experiments on living specimens.

  1. Dental Malformations Associated with Biallelic MMP20 Mutations, S-K. Wang, H. Zhang, M.B. Chavez, Y. Hu, F. Seymen, M. Koruyucu, Y. Kasimoglu, C.D. Colvin, T.N. Kolli, M.H. Tan, Y-L. Wang, P-Y. Lu, J-W. Kim, B.L. Foster, J.D. Bartlett, J.P. Simmer, J.C.-C. Hu, Molecular Genetics & Genomic Medicine, 2020
  2. Dynamics of Particle-Assisted Abnormal Grain Growth Revealed through Integrated Three-Dimensional Microanalysis, N. Lu, J. Kang, N. Senabulya, R. Keinan, N. Gueninchault, A.J. Shahani, Acta Materialia, 195, 1-12, 2020
  3. PolyProc: A Modular Processing Pipeline for X-ray Diffraction Tomography, J. Kang, N. Lu, I. Loo, N. Senabulya, A. Shahani, Integrating Materials and Manufacturing Innovation, 8, 388-399, 2019