The Michigan Center for Materials Characterization, also known as (MC)2, is the University of Michigan’s facility dedicated to the micron and nanoscale imaging and analysis of materials. Only two years old, (MC)2, housed in Building 22 of the North Campus Research Complex, continues on its successful path to provide state-of-the-art instruments, professional training, and in-depth education for students and researchers from all across campus, local industry, and fellow academic institutions. (MC)2 supports a diverse multi-disciplinary user base of more than 450 users from various colleges and departments across the U-M campus, more than 100 internal research groups, and over 20 non-academic companies.
We unveiled our new Zeiss Xradia Versa 520 instrument in early 2018. X-ray micro computed tomography (micro CT) is X-ray imaging in 3D, using a similar method to that of hospital CT (or “CAT”) scan systems, but on a fine scale with significantly increased resolution. As a 3D microscopy technique, it allows the very fine-scale internal structure of objects to be imaged non-destructively.
Center director, Emmanuelle Marquis, Associate Professor of Materials Science and Engineering, together with a number of colleagues from across campus, recently received a grant from the National Science Foundation – Major Instrumentation (NSF-MRI) Program, which allowed (MC)2 to acquire a new scanning electron microscope for real-time studies of materials behaviors. This TESCAN RISE system, a variable pressure SEM, with in-situ Raman spectroscopy and imaging capability, a full cathodoluminescence system, an electron back-scattered diffraction system, an X-ray energy dispersive spectrometry system, and a high temperature heating stage, has been installed and is now available to users.
(MC)2 is also in the process of upgrading the camera on the JEOL 3100R05 microscope to facilitate in-situ imaging, fast acquisition video recording, and low-dose electron energy loss spectroscopy, by installing a Gatan K2 camera.