The Michigan Center for Materials Characterization, also known as (MC)2, is the University of Michigan’s facility dedicated to the micron and nanoscale imaging and analysis of materials. The center, housed in Building 22 of the North Campus Research Complex, provides state-of-the-art instruments, professional training, and in-depth education for students and other internal researchers, fellow academic institutions, and local industry. (MC)2 supports a diverse multi-disciplinary user base of more than 450 users from various colleges and departments, 100+ internal research groups, and over 20 non-academic companies.
The center has recently acquired an FEI Helios G4 PFIB UXe, a high-resolution SEM with an Xe plasma focused ion beam, which is now available to users. In October 2019, an FEI Talos F200X G2, a 200 kV FEG scanning transmission electron microscope (S/TEM), will be installed.
Another new development is that (MC)2 is collaborating with the Michigan Ion Beam Lab (MIBL) in providing rare opportunities for in-situ irradiation studies using the FEI Tecnai G2 F30 TWIN, a 300 kV transmission electron microscope interfaced with a particle accelerator and a low energy ion source. Two separate ion species can be combined for delivery to the TEM stage. This experimental setup makes University of Michigan one of only a few locations in the U.S. to offer an ion beam and electron beam combination: see more information here. As of September, the system is now available for training and service requests.
The center is also currently in the process of upgrading the camera on the JEOL 3100R05 microscope to facilitate in-situ imaging, fast acquisition video recording, and low-dose electron energy loss spectroscopy, by installing a Gatan K2 camera.
In early 2018, we unveiled our new Zeiss Xradia Versa 520 instrument. X-ray micro computed tomography (micro CT) is X-ray imaging in 3D, using a similar method to that of hospital CT (or “CAT”) scan systems, but on a fine scale with significantly increased resolution. As a 3D microscopy technique, it allows the very fine-scale internal structure of objects to be imaged non-destructively.