News & Events

(MC)2 supports the Microanalysis Society’s Topical Conference on EBSD

(MC)2 was excited to host a Microanalysis Society topical conference on Electron Backscatter Diffraction (EBSD) this May 23–25, bringing together over 170 participants internationally, including students, researchers, and vendors. The conference featured three days of lectures and animated conversation on EBSD applications and developments within materials science, geoscience, planetary science, engineering, and industry. The dynamic conference format combined interactive live demonstrations from vendors using (MC)2 equipment to showcase the latest EBSD hardware and software with poster and plenary sessions held in NCRC’s Football Room.

Luke Brewer (U. Alabama) Presents on Metallurgical Sample Preparation

Along with talks on EBSD technology, Day 1 provided lab demonstrations on a flexible sign-up basis. Students and others seeking even more hands-on insights on EBSD methods were treated to tutorials in geoscience and engineering materials within the (MC)2 laboratory space.

The theme of Day 2 was “EBSD for Characterization of Microstructure Evolution” and also featured a poster session with over forty participants. Day 3 emphasized advances in EBSD technology and data analysis, such as Bayesian approaches on how to most effectively use data mining approaches to assist in analyzing materials.

Engineering Materials Demo

Represented vendors throughout the duration of the conference included Bruker, EDAX, Oxford Instruments, TESCAN, Thermo Scientific, ZEISS Microscopy, JEOL, Hitachi, Gatan, E.A. Fischione, EXpressLO LLC, Leica Microsystems, Mager Scientific, Cambridge Press, Buelher, BLG Vantage, NanoMEGAS, and Bluequartz.

The next Microanalysis Society annual topical conference will be held at the University of Minnesota from June 24–27, 2019, with a focus on quantitative microanalysis.

Q & A with Ralf Hielscher Following “A Poor Man’s Approach to HR-EBSD”
Vendor Demonstration by EDAX


Michigan Microscopy & Microanalysis Society (MMMS) & (MC)2 Open Day 

Wednesday November 1st 2017

Michigan Microscopy & Microanalysis Society (MMMS) & (MC)2 Open Day 

Presentations, Tour, Poster and image competition. Keynote presentations include:

  • Determining atomic structure across scale & dimensions with highly convergent electron beamsProf. Robert Hovden, Materials Science and Engineering, University of Michigan
  • Using cryo-electron microscopy to visualize the function of PMP22, a major cause of Charcot-Marie-Tooth disease (CMTD)Prof. Melanie Ohi, Life Sciences Institute, University of Michigan
  • Shaping (and reshaping) biological membrane architecture for vertebrate photoreceptor health (and disease)Prof. Andrew Goldberg, Biomedical Sciences, Oakland University
  • Ultrasonic Fatigue and its role in Materials Centric Design, Dr. Jason W. Carroll, Eaton Corporation.
  • Micro-Raman analyses of Earth and Planetary Materials: Advantages and Challenges, Prof. Jackie Li, Earth and Environmental Sciences, University of Michigan

Submit an abstract (deadline: October 10th 2017) 


Ultramicrotomy workshop*

* Sponsored by Electron Microscopy Sciences, Diatome, and Mager Scientific, Inc.

Sign up!

Agenda

October 28, 2015- Wednesday

1:00pm – 3:00 pm: Gathering, Samples/questions collection and instrument setups in (MC)2

3:00pm – 5:00 pm: Lecture in room 122 Building 18, NCRC

Lecturers: Helmut Gnaegi and Mike Boykin

 

October 29, 2015- Thursday

8:30 am-11:30 am: Hands-on demo in (MC)2

Instructors: Helmut Gnaegi and Mike Boykin

11:30 am – 12:30 pm: Lunch (on your own)

12:30 pm – 2:30pm: Hands-on demo (continued)

Instructors: Helmut Gnaegi and Mike Boykin

2:30 pm -3:00 pm: Wrap-up and closing remark

 

Instructors:

Helmut Gnaegi (helmut.gnaegi@diatome.ch)
Diatome Ltd
http://www.diatome.ch/
Mike Boykin (MBoykin@magersci.com)
Mager Scientific, Inc.
http://www.magersci.com/


 


Atomic Scale in Situ Electron Microscopy: Understand Structure-Property Relationships in Nanomaterials

Friday Oct 16th, 10:30 – 1571 G.G. Brown

Jeorg Jinschek, FEI Company

The strong focus on more efficient energy use and conversion, on more efficient transportation, and on environmental protecting technologies relies heavily on the advancement of (new) functional nanomaterials and nanosystems. At any stage in research and development, studies of these nanomaterials’ structure, properties, and function are critical, including detailed atomic-scale insights. Progress in technology and methodology has made scanning / transmission electron microscopes (S/TEM) powerful and indispensable tools for characterizing nanostructures, e.g. [1-3]. However, studies e.g. at room temperature and/or under standard high vacuum conditions might be inadequate to investigate the actual functional state of a material or system, whose properties depend on varying operating or environmental conditions. Fortunately, in recent years the technology has also been significantly advanced to enable in situ studies while maintaining high-resolution imaging and analytical capabilities when applying in situ stimuli to functional nanomaterials, such as temperature, current, gas etc. For instance, implementation of differential pumping apertures in an aberration corrected TEM [4] enables environmental studies, e.g. oxidation, reduction, or corrosion experiments [5]. In this contribution I will describe the path to have an accurate knowledge and control of experimental conditions in advanced in situ S/TEM experiments [6]. Special attention will be given to the temperature accuracy and uniformity provided by MEMS-based heating stages and the image resolution and sensitivity in ETEM gas environments [4]. Recent application examples will be presented to highlight these in situ S/TEM capabilities [5-7].

[1] J. R. Jinschek, et al., Carbon 49, 556 (2011)

[2] D. Van Dyck, et al., Nature 486, 243 (2012)

[3] K. Urban, et al., PRL 110, 185507 (2013)

[4] J. R. Jinschek, et al., Micron 43, 1156 (2012)

[5] J. R. Jinschek, Chemical Communications 50, 2696 (2014)

[6] S. Helveg, et al., Micron 68, 176 (2015)

[7] H. Yoshida, et al., Science 335, 317 (2012)


John Mansfield, named Senior Director of Education and Engagement

In 1987, Dr. John Mansfield joined the University of Michigan as the laboratory manager of the north campus Electron Microbeam Analysis Laboratory (EMAL) and then, from 2005 as the laboratory manager and associate director, successfully growing an initially small transmission electron microscopy facility with 3 TEMs and 1 XPS system, into a much larger materials characterization facility currently serving over 450 users. Beyond the technical expertise and support on the instruments, the Center is now looking to broaden its mission to include education and experiential learning in advanced materials characterization.  In his new role as the Senior Director of Education and Engagement, Dr. Mansfield will teach a graduate level electron microscopy course, and a series of tutorial seminars targeting new students, industrial researchers, and users looking to expand their knowledge base about advanced electron microscopy, diffraction and spectroscopy techniques. He will also organize outreach events and develop the framework for a future (MC)2 certificate program in materials characterization.


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