(MC)2 is starting an image submission contest to share a glimpse into the diverse research of academic users at the center. The contest is open to (MC)2 users who are graduate students and post-docs at the University of Michigan or other universities. The winner will receive a $50 gift card to a local restaurant.
Submissions for the first contest will be accepted until November 5, 2018; results will be announced shortly after this date. All entries will be considered rolling submissions and remain in contention for future contests, however, so may still be selected for a prize at a later date.
Entrants allow the center permission to publish any images on our website, twitter, or other media.
Please upload the highest quality image with regard to file size, bit depth, and resolution. Preferred image width is 1024 px or above. Image should be in .tif format.
Images must be obtained using instruments at the center, but may be modified aesthetically if you choose. You can enter the contest here:
All entries should include the following:
- A title for the image
- A clear and detailed legend
- A description of the image providing scientific context (one paragraph)
- Details on any artistic modification of the image, if relevant
(MC)2 was excited to host a Microanalysis Society topical conference on Electron Backscatter Diffraction (EBSD) this May 23–25, bringing together over 170 participants internationally, including students, researchers, and vendors. The conference featured three days of lectures and animated conversation on EBSD applications and developments within materials science, geoscience, planetary science, engineering, and industry. The dynamic conference format combined interactive live demonstrations from vendors using (MC)2 equipment to showcase the latest EBSD hardware and software with poster and plenary sessions held in NCRC’s Football Room.
Along with talks on EBSD technology, Day 1 provided lab demonstrations on a flexible sign-up basis. Students and others seeking even more hands-on insights on EBSD methods were treated to tutorials in geoscience and engineering materials within the (MC)2 laboratory space.
The theme of Day 2 was “EBSD for Characterization of Microstructure Evolution” and also featured a poster session with over forty participants. Day 3 emphasized advances in EBSD technology and data analysis, such as Bayesian approaches on how to most effectively use data mining approaches to assist in analyzing materials.
Represented vendors throughout the duration of the conference included Bruker, EDAX, Oxford Instruments, TESCAN, Thermo Scientific, ZEISS Microscopy, JEOL, Hitachi, Gatan, E.A. Fischione, EXpressLO LLC, Leica Microsystems, Mager Scientific, Cambridge Press, Buelher, BLG Vantage, NanoMEGAS, and Bluequartz.
Financial support for student travel was made possible through a National Science Foundation Award #1829336.
Wednesday November 1st 2017
Michigan Microscopy & Microanalysis Society (MMMS) & (MC)2 Open Day
- Determining atomic structure across scale & dimensions with highly convergent electron beams, Prof. Robert Hovden, Materials Science and Engineering, University of Michigan
- Using cryo-electron microscopy to visualize the function of PMP22, a major cause of Charcot-Marie-Tooth disease (CMTD), Prof. Melanie Ohi, Life Sciences Institute, University of Michigan
- Shaping (and reshaping) biological membrane architecture for vertebrate photoreceptor health (and disease), Prof. Andrew Goldberg, Biomedical Sciences, Oakland University
- Ultrasonic Fatigue and its role in Materials Centric Design, Dr. Jason W. Carroll, Eaton Corporation.
- Micro-Raman analyses of Earth and Planetary Materials: Advantages and Challenges, Prof. Jackie Li, Earth and Environmental Sciences, University of Michigan
Submit an abstract (deadline: October 10th 2017)
* Sponsored by Electron Microscopy Sciences, Diatome, and Mager Scientific, Inc.
October 28, 2015- Wednesday
1:00pm – 3:00 pm: Gathering, Samples/questions collection and instrument setups in (MC)2
3:00pm – 5:00 pm: Lecture in room 122 Building 18, NCRC
Lecturers: Helmut Gnaegi and Mike Boykin
October 29, 2015- Thursday
8:30 am-11:30 am: Hands-on demo in (MC)2
Instructors: Helmut Gnaegi and Mike Boykin
11:30 am – 12:30 pm: Lunch (on your own)
12:30 pm – 2:30pm: Hands-on demo (continued)
Instructors: Helmut Gnaegi and Mike Boykin
2:30 pm -3:00 pm: Wrap-up and closing remark
Friday Oct 16th, 10:30 – 1571 G.G. Brown
Jeorg Jinschek, FEI Company
The strong focus on more efficient energy use and conversion, on more efficient transportation, and on environmental protecting technologies relies heavily on the advancement of (new) functional nanomaterials and nanosystems. At any stage in research and development, studies of these nanomaterials’ structure, properties, and function are critical, including detailed atomic-scale insights. Progress in technology and methodology has made scanning / transmission electron microscopes (S/TEM) powerful and indispensable tools for characterizing nanostructures, e.g. [1-3]. However, studies e.g. at room temperature and/or under standard high vacuum conditions might be inadequate to investigate the actual functional state of a material or system, whose properties depend on varying operating or environmental conditions. Fortunately, in recent years the technology has also been significantly advanced to enable in situ studies while maintaining high-resolution imaging and analytical capabilities when applying in situ stimuli to functional nanomaterials, such as temperature, current, gas etc. For instance, implementation of differential pumping apertures in an aberration corrected TEM  enables environmental studies, e.g. oxidation, reduction, or corrosion experiments . In this contribution I will describe the path to have an accurate knowledge and control of experimental conditions in advanced in situ S/TEM experiments . Special attention will be given to the temperature accuracy and uniformity provided by MEMS-based heating stages and the image resolution and sensitivity in ETEM gas environments . Recent application examples will be presented to highlight these in situ S/TEM capabilities [5-7].
 J. R. Jinschek, et al., Carbon 49, 556 (2011)
 D. Van Dyck, et al., Nature 486, 243 (2012)
 K. Urban, et al., PRL 110, 185507 (2013)
 J. R. Jinschek, et al., Micron 43, 1156 (2012)
 J. R. Jinschek, Chemical Communications 50, 2696 (2014)
 S. Helveg, et al., Micron 68, 176 (2015)
 H. Yoshida, et al., Science 335, 317 (2012)