We invite all academic lab users to enter a new round of the (MC)2 image contest by Monday, December 5. Click here for the entry form. Results will be announced within two weeks of the deadline.
The contest will be judged by (MC)2 staff, and this time we will select both a winner and runner-up in three categories: (1) Best TEM Micrograph, (2) Best SEM Micrograph, and (3) Best Non-Electron Image. The non-electron image category includes techniques such as AFM, CT, and atom probe tomography, or other instances where images are constructed during data processing. Lab users are welcome to submit multiple entries in one or more categories.
Please see the following guidelines:
- Images must have been obtained using an instrument at the center within the last two years.
- Creative false coloring is appreciated but we prefer that other artistic modifications are kept limited (such as adding external images in Photoshop) in order to emphasize the features of the micrograph as originally acquired on the tool.
- Submissions should include a paragraph with scientific context.
- Please upload the highest quality image you can with regard to file size, bit depth, and resolution. Preferred image width is 1024 px or above and in .tif format.
First-place winners in each category will receive a $100 Amazon gift card, and runners-up will receive a $50 gift card, in addition to an award certificate and display in the (MC)2 office.
All participants grant (MC)2 permission to use the images in the future in various forms, such as the photo collage in the Building 22 hallway, brochures, educational materials for other users, our website or other media.
Note: the deadline for the Best Non-Electron Image category has been extended to Sunday, December 11th.