Materials Science and Geological Sciences
- Surface imaging (topology, chemistry, phase contrast)
- Orientation imaging (automated large scale, image stitching)
Location: Room G027
Publications, presentations, and posters resulting from work on this instrument should state: “The authors acknowledge financial support from the University of Michigan College of Engineering and technical support from the Michigan Center for Materials Characterization.“
- Accelerating Voltage 0-30kV
- SEM Resolution
- Sample Requirements
- Samples must be compatible with high vacuum, i.e., clean and dry. Samples should be handled with tweezers or gloves.
- A large range of sample sizes will fit into the chamber up to a limit of about 6 inches in diameter and/or ~ 2 inches tall. You may not be able to access the entire area of a very wide sample. Ask for assistance if you are approaching the limits.
- Samples need to be conductive. Semi-conductors are OK. Non-conductive samples should be coated with a conductive layer. Conductive samples surrounded by a non-conducting medium should be provided a conductive path to the SEM stub.
References and Publications
- Solar Water Oxidation by an InGaN Nanowire Photoanode with a Bandgap of 1.7 eV, S. Chu, S. Vanka, Y. Wang, J. Gim, Y. Wang, Y. Ra, R. Hovden, H. Guo, I. Shih, and Z. Mi, ACS Energy Letters, 3, 307-314, 2018
- Grain size effects on NiTi shape memory alloy fatigue crack growth, W LePage, A Ahadi, W Lenthe, QP Sun, T Pollock, J Shaw, S Daly, Journal of Materials Research, 33(2), 91-107, 2018
- Deformation behavior of β’ and β”’ precipitates in Mg-RE alloys, ELS Solomon, EA Marquis, Materials Letters (2017)