Category: Uncategorized

We are excited to announce the winners of the annual (MC)² image contest. Winners were selected by the (MC)² scientists, who considered both creative and scientific elements of the submissions. Continue Reading »

On October 12, (MC)² scientists assisted in providing a workshop at the center as part of the Hands-On Trainings in Semiconductors (HOTIS) program, a pilot initiative coordinated by Professor Valeria Bertacco, designed to introduce high school and community college students to semiconductor technology. Continue Reading »

A new Kratos Axis Supra+ XPS has now been installed at (MC)². This is a state-of-the-art correlative spectroscopy and imaging system for surface science. The system can perform the following functions:

–      X-ray Photoelectron Spectroscopy and mapping

–      Hard X-ray photoelectron spectroscopy (HAXPES) with the Ag L⍺ anode

–      Ultraviolet Photoelectron Spectroscopy

–      Auger Spectroscopy and mapping

–      Secondary Electron Imaging

–      Ion Scattering Spectroscopy

–      Reflection Energy Electron Loss Spectroscopy

–      Heating and cooling stage

–      Electrical biasing

–      Air sensitive sample preparation with attached glove box

–      Air sensitive shuttle holder for transport

–      Depth profiling for organic (Ar_n⁺ cluster mode) and inorganic (monatomic Ar⁺) materials

Detailed specifications are available on the instrument webpage:

Kratos Axis Supra+ XPS

The system is now available for training and service work. Continue Reading »

We are excited to host our second annual facility user meeting on Friday, November 22. The agenda is now available below. 

Users and faculty PIs are encouraged to register to attend the meeting using this form:

(MC)2 User Meeting Registration

The (MC)² annual image contest is accepting submissions from now until Monday, December 2. The contest is open to all graduate students and postdoctoral researchers who are users of the lab, from U-M or other universities.  Continue Reading »

Dr. Tao Ma, (MC)² Lead TEM Scientist, will be presenting in Oakland University’s Department of Physics Colloquium, on October 10 (12:00-1:00 PM, Room 185 MSC). 

Atomistic characterizations of functional materials via transmission electron microscopy

Transmission electron microscopy (TEM) has revolutionized materials characterization by enabling imaging and spectroscopy at atomic resolution, owing to significant advances such as aberration correctors and different imaging techniques. Continue Reading »

We will be hosting a FIB related “Lunch and Learn” seminar on Wednesday October 2^nd from 12:00 to 1:30 PM in the NCRC Building 10 South Atrium. The (MC)² FIB Scientist Dr. Continue Reading »

On March 19th, (MC)² hosted a lunch & learn session on EDS analysis, a cornerstone technique in materials characterization, in both SEM and TEM. 

Energy Dispersive X-ray Spectroscopy Analysis in Scanning Electron Microscopy and Transmission Electron Microscopy 

When: March 19, from noon to 1:30 pm

Where: South Atrium, NCRC Building 10

This seminar provided a look into the world of EDS analysis, through the journey of x-rays from their generation to collection to quantification.  Continue Reading »

The Michigan Materials Research Institute (MMRI) held their annual summit on May 30-31, 2024, in the NCRC Building 18 Dining Hall. (MC)² is a core facility of MMRI, and center staff participated in the summit. Continue Reading »

Date: Wednesday, June 19, 2024
Time: 9:00 AM — 5:00 PM
Location: University of Michigan (Online Option Available), South Atrium of NCRC Building 10, Ann Arbor, MI

Modern electron microscopy is much more than just TEM imaging. Continue Reading »

We are happy to announce the winners of the (MC)² annual image contest. The contest was judged by center staff and featured two categories: (1) Transmission Electron Microscopy and (2) Scanning Electron Microscopy/X-ray Microscopy/Other. Continue Reading »

Organizers: Dr. Haiping Sun, Dr. Tao Ma and Dr. Kai Sun

Date: Monday 12/04/2023

Time: 12pm to 1:30pm

Location: NCRC B32 Auditorium (Rm 1501)

 

This is a lunchtime mini-seminar for our current S/TEM users and others who may wish to use this technique in their future research.

(MC)² now has a faculty advisory council. The 2023-2024 members and roles of the council are outlined below.

The (MC)² annual image contest is accepting submissions from now until Friday, December 1st. The contest is open to all graduate students and postdoctoral researchers who are users of the lab, from U-M or other universities.  Continue Reading »

Bruker has organized a workshop at NCRC on November 8-9 focusing on advances in nanomechanical testing of materials including nanoindentation techniques, atomic force microscopy, in-situ testing in scanning electron microscopy, and transmission electron microscopy. Continue Reading »

From MSE press release: Professor Robert Hovden has been selected as a 2023 DOE Early Career Research Award recipient. He is one of 93 scientists across the nation to receive the honor. Continue Reading »

A Bruker Hysitron PI 89 PicoIndenter has recently been installed on our TESCAN MIRA3 SEM, which makes it possible to perform nanomechanical testing while simultaneously imaging.

The PI 89 has a standard low load (maximum indent 10mN / tensile 10mN) transducer and a high load (maximum indent 500mN / tensile 100mN) transducer. Continue Reading »

Enhancing Understanding of Materials’ Mechanical Performance through In-Situ Nanomechanical Testing Approach

Nan Li
Los Alamos National Laboratory, Los Alamos, NM
<[email protected]>

Monday, June 26th
11 AM – Noon
NCRC Building 10 South Atrium

Abstract: During his presentation, Dr. Continue Reading »