New Kratos Axis Supra+ XPS

A new Kratos Axis Supra+ XPS has now been installed at (MC)2. This is a state-of-the-art correlative spectroscopy and imaging system for surface science. The system can perform the following functions:

–      X-ray Photoelectron Spectroscopy and mapping

–      Hard X-ray photoelectron spectroscopy (HAXPES) with the Ag L⍺ anode

–      Ultraviolet Photoelectron Spectroscopy

–      Auger Spectroscopy and mapping

–      Secondary Electron Imaging

–      Ion Scattering Spectroscopy

–      Reflection Energy Electron Loss Spectroscopy

–      Heating and cooling stage

–      Electrical biasing

–      Air sensitive sample preparation with attached glove box

–      Air sensitive shuttle holder for transport

–      Depth profiling for organic (Arn+ cluster mode) and inorganic (monatomic Ar+) materials

Detailed specifications are available on the instrument webpage:

Kratos Axis Supra+ XPS

The system is now available for training and service work. New users should see steps on the “Become a User” page. Anyone with questions about the equipment capabilities or applicability for their research may reach out to the XRM scientist, Dr. Nancy Muyanja ([email protected]).