Lead XRM Scientist Nancy Muyanja prepares a 18650 Cell by placing it in the Zeiss Xradia Versa 520 X-ray Microscope
Welcome
The Michigan Center for Materials Characterization, also known as (MC)2, is the University of Michigan’s facility dedicated to the micron and nanoscale imaging and analysis of materials. The center, housed in Building 22 of the North Campus Research Complex, provides state-of-the-art instruments, professional training, and in-depth education for students and other internal researchers, fellow academic institutions, and local industry. (MC)2 supports a diverse multi-disciplinary user base of more than 450 users from various colleges and departments, 100+ internal research groups, and over 20 non-academic companies.
Instrumentation Updates
We have recently installed a Kratos Axis Supra+ XPS, an advanced correlative spectroscopy and imaging system for surface science.
Prior to this, the Center acquired a Thermo Fisher Spectra 300 Probe Cs-corrected S/TEM, featuring high resolution STEM imaging, ultrafast elemental mapping, high energy resolution monochromated EELS, and 4D-STEM.
(MC)2 is also collaborating with the Michigan Ion Beam Lab (MIBL) in providing unique opportunities for in-situ irradiation studies using the Thermo Fisher Tecnai G2 F30 TWIN, a 300 kV transmission electron microscope interfaced with a particle accelerator and a low energy ion source. Two separate ion species can be combined for delivery to the TEM stage. This experimental setup makes University of Michigan one of only a few locations in the U.S. to offer an ion beam and electron beam combination: see more information here.