JEOL 2010F analytical electron microscope

Contact: Haiping Sun

Live webcam

Location: Room G020
Phone:+1 (734) 764-5625 
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of the University of Michigan College of Engineering and NSF grant #DMR-9871177.

Specifications

Accelerating Voltage

  • 0 to 200 kV (50 V steps)

Filament

  • Zirconated Tungsten (100) thermal field emission tip

Vacuum

  • ~1.5 x10-7 torr

Resolution

  • CTEM 0.10 nm lattice / 0.25 nm point-to-point
  • STEM 0.17 nm HAADF (high angle annular dark field)

XEDS System

  • Horizontal Ultra-thin Window Si-Li X-ray detector (active area = 30 mm2) capable of detecting elements with Z >5.
  • EDAX r-TEM Detector with EDAX acquisition software 

EELS System

  • Gatan Imaging Filter (GIF) for electron energy loss spectroscopy and imaging.

Image Acquisition & Analysis System

  • Gatan #794 cooled multi-scan CCD TV camera for high resolution imaging (above the GIF)
  • Gatan #692 Retractable TV rate CCD TV camera.

Sample Holders

  • JEOL Single-Tilt Stage
  • JEOL Double-Tilt Analytical Stage
  • Gatan #646 Double-Tilt (x=±35 degrees, y=±35 degrees) Low Background (Be) Stage with Faraday cup.
  • Gatan #636 Double-Tilt (x=±35 degrees, y=±35 degrees) Low Background (Be) Liquid-Nitrogen Stage.
  • Gatan #652 Double-Tilt Heating Holder with a maximum operating temperature of 1000 degrees Celsius.

Other Accesories

  • Free lens control, fully independent control of all lenses.
  • FasTEM remote NT server based control system.