Veeco Dimension Icon Atomic Force Microscope


Materials Science, Biological Sciences, and Geological Sciences


Haiping Sun 
Location: Room G022


Publications, presentations, and posters resulting from work on this instrument should state: “The authors acknowledge the financial support of the University of Michigan College of Engineering, and technical support from the Michigan Center for Materials Characterization.”


  • Available Testing Modes
    • ScanAsyst
      • In Air/Fluid
    • Tapping: Amplitude “Set Point”
      • Soft Tapping: With Tip barely off the surface; default free air amplitude is 300mV
      • Standard: Default free air amplitude is 500mV
    • Contact: Deflection “Set Point”
      • In Air/Fluid: Fluid eliminates attractive forces and good for biological delicate samples
      • Lateral Force Microscopy (LFM): Surface frictional characteristics; use low spring constant probes (~0.01 -2 N/m)
    • Mechanical Properties
      • Force Volume: Map the interaction forces between a sample and the AFM tip; applications include elasticity, adhesion, electrostatic, magnetic and binding studies
      • Peak Force Quantitative Nanomechanical Mapping: Maps nano mechanical properties, such as modulus (1MPa to 50GPa), adhesion (10pN to 10uN)
    • Electrical and Magnetic
      • Electrical and Magnetic Lift Modes
        • MFM & EFM: Tapping mode interleave techniques; maps of local electrostatic or magneto static forces; phase lag detection; map of frequency to keep constant phase
        • Surface Potential (AM-KPFM): Tapping mode interleave techniques; constant height above surface while applying both an AC and a DC signal to the probe
        • DAFMCH holder with conductive tapping mode probes: SCM-PIT, MESP or DDESP
      • Piezoresponse Force Microscopy (PFM)
        • Optimized Vertical Domains: Imaging of response of a piezoelectric material with applied local AC electric field by the tip; polarization and orientation of domains can be mapped
        • DAFMCH holder with conductive tips (MESP-RC, SCM-PIT, MESP, DDESP, or OSCM-PT)
  • Scanner
    • Scanner range: 85 µm by 85 µm
    • Scanner rate: <9.77Hz
    • Tip velocity: <1912um/s
    • Sanning lines: <4096
    • Z Noise (Height Sensor): 0.014nm
    • Z Noise (Height): 0.02nm
    • X-Y Resolution: Heavily sample roughness and tip radius dependent
  • System
    • Vibration isolation system and environmental enclosure for high-resolution imaging
    • Noise Floor: <0.03nm RMS
    • Digital image acquisition of optical microscope images
  • Accessories
    • Standard DAFMCH holder with maximum Z range 600nm
    • Fluid Mode Holder (DTFM-DD)
  • Sample Requirements
    • The sample vacuum platen can take up to 200mm diameter samples.
    • The maximum Z scanning range is 9 µm. For better scanning quality, try to make the sample surface smooth and clean.
    • The maximum height of a sample is of the order of 12 mm.

References and Publications

  1. Bi-enhanced N incorporation in GaAsNBi alloys, J Occena, T Jen, EE Rizzi, TM Johnson, J Horwath, YQ Wang, RS Goldman, Applied Physics Letters, 110(24), 242102, 2017
  2. Influence of surface reconstruction on dopant incorporation and transport properties of GaAs(Bi) alloys, RL Field III, J Occena, T Jen, D Del Gaudio, B Yarlagadda, C Kurdak, RS Goldman, Applied Physics Letters, 109(25), 252105, 2016