Veeco Dimension Icon Atomic Force Microscope


Materials Science, Biological Sciences, and Geological Sciences


Haiping Sun 
Location: Room G022


Publications, presentations, and posters resulting from work on this instrument should state: “The authors acknowledge the financial support of the University of Michigan College of Engineering, and technical support from the Michigan Center for Materials Characterization.”


  • Scanner range: 90 µm by 90 µm
  • Resolution: Heavily sample and technique dependent
  • Accessories
    • High Efficiency Direct Drive Tapping Mode Cantilever Holder for Scanning in Fluid
    • Vibration isolation system and environmental enclosure for high-resolution imaging
    • Digital image acquisition of optical microscope images
  • Sample Requirements
    • The sample vacuum platen can take up to 200mm diameter samples. 
    • The maximum Z scanning height is of the order of 5 µm. 
    • The maximum height of a sample is of the order of 12 mm.

References and Publications

  1. Bi-enhanced N incorporation in GaAsNBi alloys, J Occena, T Jen, EE Rizzi, TM Johnson, J Horwath, YQ Wang, RS Goldman, Applied Physics Letters, 110(24), 242102, 2017
  2. Influence of surface reconstruction on dopant incorporation and transport properties of GaAs(Bi) alloys, RL Field III, J Occena, T Jen, D Del Gaudio, B Yarlagadda, C Kurdak, RS Goldman, Applied Physics Letters, 109(25), 252105, 2016