Veeco Dimension Icon Atomic Force Microscope

Applications

Materials Science, Biological Sciences, and Geological Sciences

Contact

Haiping Sun

Location

Room G022

Acknowledgments

Publications, presentations, and posters resulting from work on this instrument should state: “The authors acknowledge the financial support of the University of Michigan College of Engineering, and technical support from the Michigan Center for Materials Characterization.”

Specifications

  • Available Testing Modes
    • ScanAsyst
      • In Air/Fluid
    • Tapping: Amplitude “Set Point”
      • Soft Tapping: With Tip barely off the surface; default free air amplitude is 300mV
      • Standard: Default free air amplitude is 500mV
    • Contact: Deflection “Set Point”
      • In Air/Fluid: Fluid eliminates attractive forces and good for biological delicate samples
      • Lateral Force Microscopy (LFM): Surface frictional characteristics; use low spring constant probes (~0.01 -2 N/m)
    • Mechanical Properties
      • Force Volume: Map the interaction forces between a sample and the AFM tip; applications include elasticity, adhesion, electrostatic, magnetic and binding studies
      • Peak Force Quantitative Nanomechanical Mapping: Maps nano mechanical properties, such as modulus (1MPa to 50GPa), adhesion (10pN to 10uN)
    • Electrical and Magnetic
      • Electrical and Magnetic Lift Modes
        • MFM & EFM: Tapping mode interleave techniques; maps of local electrostatic or magneto static forces; phase lag detection; map of frequency to keep constant phase
        • Surface Potential (AM-KPFM): Tapping mode interleave techniques; constant height above surface while applying both an AC and a DC signal to the probe
        • DAFMCH holder with conductive tapping mode probes: SCM-PIT, MESP or DDESP
      • Piezoresponse Force Microscopy (PFM)
        • Optimized Vertical Domains: Imaging of response of a piezoelectric material with applied local AC electric field by the tip; polarization and orientation of domains can be mapped
        • DAFMCH holder with conductive tips (MESP-RC, SCM-PIT, MESP, DDESP, or OSCM-PT)
  • Scanner
    • Scanner range: 85 µm by 85 µm
    • Scanner rate: <9.77Hz
    • Tip velocity: <1912um/s
    • Sanning lines: <4096
    • Z Noise (Height Sensor): 0.014nm
    • Z Noise (Height): 0.02nm
    • X-Y Resolution: Heavily sample roughness and tip radius dependent
  • System
    • Vibration isolation system and environmental enclosure for high-resolution imaging
    • Noise Floor: <0.03nm RMS
    • Digital image acquisition of optical microscope images
  • Accessories
    • Standard DAFMCH holder with maximum Z range 600nm
    • Fluid Mode Holder (DTFM-DD)
  • Sample Requirements
    • The sample vacuum platen can take up to 200mm diameter samples.
    • The maximum Z scanning range is 9 µm. For better scanning quality, try to make the sample surface smooth and clean.
    • The maximum height of a sample is of the order of 12 mm.

References and Publications

  1. Bi-enhanced N incorporation in GaAsNBi alloys, J Occena, T Jen, EE Rizzi, TM Johnson, J Horwath, YQ Wang, RS Goldman, Applied Physics Letters, 110(24), 242102, 2017
  2. Influence of surface reconstruction on dopant incorporation and transport properties of GaAs(Bi) alloys, RL Field III, J Occena, T Jen, D Del Gaudio, B Yarlagadda, C Kurdak, RS Goldman, Applied Physics Letters, 109(25), 252105, 2016