JEOL 2100 probe-corrected analytical electron microscope

Contact: Kai Sun

Live webcam

Location: Room G032 
Phone: +1 (734) 764-2938 
Acknowledgments: Publications resulting from work on this instrument should acknowledge the support of the University of Michigan College of Engineering and NSF grant #DMR-0723032.

Specifications

Accelerating Voltage

  • 100 and 200 kV

Filament

  • Zirconated Tungsten (100) thermal field emission tip

Vacuum

  • Gun ~1.0 x 10-9 torr
  • Column ~1.0 x 10-7 torr

Resolution

  • CTEM 0.10 nm lattice / 0.0.19 nm point-to-point
  • STEM 0.10 nm Cs-Corrected HAADF (high angle annular dark field)

XEDS System

  • Horizontal Ultra-thin Window Si-Li X-ray detector (active area = 30 mm2) capable of detecting elements with Z >5.
  • EDAX r-TEM Detector with EDAX acquisition software 

EELS System

  • Gatan #863 Tridiem Imaging Filter (GIF) for electron energy loss spectroscopy and imaging.

Image Acquisition & Analysis System

  • Gatan Ultrascan 1000 CCD TV camera for high resolution imaging (above the GIF)

Compatible sample Holders

  • JEOL Single-Tilt Stage
  • JEOL Double-Tilt Analytical Stage
  • Gatan #646 Double-Tilt (x=±35 degrees, y=±35 degrees) Low Background (Be) Stage with Faraday cup.
  • Gatan #636 Double-Tilt (x=±35 degrees, y=±35 degrees) Low Background (Be) Liquid-Nitrogen Stage.
  • Gatan #652 Double-Tilt Heating Holder with a maximum operating temperature of 1000 degrees Celsius.

Other Accesories

  • Free lens control, fully independent control of all lenses.
  • TEMCon PC control software.