Facility description

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The Michigan Center for Materials Characterization, or (MC)2,  is located in the College of Engineering on the North Campus of the University and provides services to the entire University. It is located in a custom-designed basement wing that provides approximately 4500 square feet of low-vibration, low-field, environment controlled laboratory space. The principal equipment includes:

– A Cameca Local Electrode Atom-Probe microscope (LEAP-4000HR) equipped with a reflectron for improved mass resolution with voltage pulsing and fs laser pulsing capability (200kHz).

– several transmission electron microscopes (TEM):  a JEOL 2100F Cs corrected STEM with a EDAX XEDS system and Gatan Imaging Filter; a JEOL 3100R05 cold field emission gun double Cs corrected transmission electron microscope with a Gatan Imaging Filter; a JEOL 2010F FasTEM AEM with an EDAX/Gatan XEDS, Gatan TV cameras and Imaging Filter; a JEOL 3010 HRTEM microscope;

– three dual SEM/focused ion beam (FIB) instruments: an FEI Helios DualBEAM FIB with EDAX EDS, EBSD, omniprobe manipulator, an FEI Nova 200 Nanolab Dualbeam FIB with EDAX XEDS system with omniprobe manipulators, and FEI Quanta 3D Dualbeam FIB and environmental W filament SEM (ESEM).

– two scanning electron microscopes (SEM): a FEI XL30 FEGSEM with EDAX XEDS system and a TSL orientation imaging system for EBSD analysis, a Tescan MIRA3 GMU FEGSEM with EDAX XEDS and EBSD system;

– a Veeco Dimension Icon Atomic Force Microscope

– a Kratos Axis Ultra XPS system;

– a Hysitron TI950 TriboIndenter fitted with bright field and fluorescence imaging capabilities.