Feel free to copy and paste the information below for your proposal applications. Contact us if you need more information on any of the instruments.
The Michigan Center for Materials Characterization, or (MC)2, is located in the College of Engineering on the North Campus of the University and provides services to the entire University. It is located in a custom-designed basement wing that provides approximately 4500 square feet of low-vibration, low-field, environment controlled laboratory space. The principal equipment includes:
– A Cameca Local Electrode Atom-Probe microscope (LEAP-5000HR) equipped with a reflectron for improved mass resolution with voltage pulsing and fs laser pulsing capability (250kHz).
– Four transmission electron microscopes (TEM):
- a JEOL 2100F Cs corrected STEM with a EDAX XEDS system and Gatan Imaging Filter;
- a JEOL 3100R05 cold field emission gun double Cs corrected transmission electron microscope with a Gatan Quantum GIF energy filter;
- a JEOL 2010F FasTEM AEM with an EDAX/Gatan XEDS, Gatan TV cameras and Imaging Filter;
- a JEOL 3010 HRTEM microscope;
– Three dual SEM/focused ion beam (FIB) instruments:
- an FEI Helios DualBEAM FIB with EDAX EDS, Pegasus EBSD, OmniProbe manipulator,
- an FEI Nova 200 Nanolab Dualbeam FIB with EDAX XEDS system with OmniProbe manipulators
- an FEI Quanta 3D Dualbeam FIB and environmental W filament SEM (ESEM).
– One scanning electron microscope (SEM):
- a Tescan MIRA3 GMU FEGSEM with EDAX XEDS and Pegasus EBSD system.
– A Veeco Dimension Icon Atomic Force Microscope.
– A Kratos Axis Ultra XPS system.
– A Hysitron TI950 TriboIndenter fitted with bright field and fluorescence imaging capabilities.
– A Zeiss Xradia Versa 520 3D xray microscope with LabDCT module for crystallographic analysis.