Lunch-and-Learn Seminar on 4/3: Introducing TemCompanion

We are happy to announce our next (MC)² lunch and learn seminar will be held on April 3. 
 
Date: Thursday, April 3rd
Time: 12:00 PM – 1:30 PM
Location: NCRC B10 – South Atrium
 
Introducing TemCompanion: An Open-Source Multi-Platform GUI Program for TEM Image Processing and Analysis

Presenter: Tao Ma, Lead TEM Scientist, Michigan Center for Materials Characterization 

TemCompanion is a Python-based, open-source GUI application that was designed to facilitate the processing and analysis of TEM datasets in a user-friendly environment. TemCompanion is compatible with all major operating systems, with a broad support of various file formats, including FEI Velox (.emd), Gatan DigitalMicrograph (.dm3 & .dm4), FEI TIA (.ser) files, and common image formats (tiff, png, jpg, etc.). A collection of major image processing functions is implemented, including cropping, rotating, flipping, resampling, fast Fourier transform (FFT) operations, measuring, extracting line profiles, filtering, and performing these operations on image stacks. Also available is a collection of filter functions for denoising high-resolution images. In addition to these basic functions, specialized functions such as stack alignment and integration, geometric phase analysis, and differential phase contrast reconstruction are also available. The tool can also serve as a batch format converter for data exchange. TemCompanion is written in pure Python, with the source code openly accessible. For maximum usability, executable bundles that do not require a Python environment or command-line installation have been compiled for Windows x64 and MacOS ARM. Join us for this special lunch-n-learn series for a live demo and learn more about how TemCompanion can speed up the TEM image processing and analysis.
 
TemCompanion is available for download here: TemCompanion Releases
 
Please use this form to RSVP by March 28 if you plan to attend: Lunch and Learn Registration. Pizza lunch will be provided for all attendees.