We want to thank Chris Moffitt, Applications Engineer from Kratos Analytical for giving an insightful X-Ray Photoelectron Spectroscopy (XPS) Seminar to our (MC)2 User community on February 3. The seminar was held in NCRC Building 10, rooms G063/G064. New users were introduced to the basic concepts of XPS, while advanced users and center staff were introduced to the wide range of surface characterization of modalities available on the Axis Supra+. Discussion included the following topics:
- In operando measurements involving sample biasing
- Using Escape software for peak fitting and quantitative analysis in survey spectra
- Angle resolved XPS
- XPS mapping and analysis
Our Supra+ has been in service since October 2024 and we look forward to welcoming new and existing users to do surface science measurements in the areas of XPS, Auger, ISS, UPS and REELs. See the XPS instrument page to learn more about how this tool can help new and current users achieve their research goals.
